Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy


Creative Commons License

SANDHU A., MASUDA H., KUROSAWA K., Oral A. , BENDİNG S.

ELECTRONICS LETTERS, cilt.37, ss.1335-1336, 2001 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 37 Konu: 22
  • Basım Tarihi: 2001
  • Doi Numarası: 10.1049/el:20010908
  • Dergi Adı: ELECTRONICS LETTERS
  • Sayfa Sayıları: ss.1335-1336

Özet

Bismuth nano-Hall probes with dimensions similar to 120 x 120 nm were fabricated by focused ion beam milling and used for the direct room temperature magnetic imaging of crystalline garnet thin films and strontium ferrite permanent magnets by scanning Hall probe microscopy. At driving currents of 40 muA, the Hall coefficient and magnetic field sensitivity of the Bi nano-Hall probes were 3.3 x 10(-4) CYG and 7.2 G/root Hz, respectively.