A. SANDHU Et Al. , "Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy," ELECTRONICS LETTERS , vol.37, no.22, pp.1335-1336, 2001
SANDHU, A. Et Al. 2001. Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy. ELECTRONICS LETTERS , vol.37, no.22 , 1335-1336.
SANDHU, A., MASUDA, H., KUROSAWA, K., Oral, A., & BENDİNG, S., (2001). Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy. ELECTRONICS LETTERS , vol.37, no.22, 1335-1336.
SANDHU, A Et Al. "Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy," ELECTRONICS LETTERS , vol.37, no.22, 1335-1336, 2001
SANDHU, A Et Al. "Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy." ELECTRONICS LETTERS , vol.37, no.22, pp.1335-1336, 2001
SANDHU, A. Et Al. (2001) . "Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy." ELECTRONICS LETTERS , vol.37, no.22, pp.1335-1336.
@article{article, author={A SANDHU Et Al. }, title={Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy}, journal={ELECTRONICS LETTERS}, year=2001, pages={1335-1336} }