Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes

Özer H., Atabak M., Ellialtǧlu R. M., Oral A.

Applied Surface Science, vol.188, pp.301-305, 2002 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 188
  • Publication Date: 2002
  • Doi Number: 10.1016/s0169-4332(01)00942-4
  • Journal Name: Applied Surface Science
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.301-305
  • Keywords: non-contact atomic force microscopy, small oscillation amplitudes, Si(100)(2 x 1), force-distance spectroscopy, short-range forces, REACTIVE SURFACES, NONCONTACT AFM
  • Middle East Technical University Affiliated: No

Abstract

Si(1 0 0)(2 x 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Angstrom oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM. (C) 2002 Elsevier Science B.V. All rights reserved.