H. Özer Et Al. , "Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes," Applied Surface Science , vol.188, pp.301-305, 2002
Özer, H. Et Al. 2002. Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes. Applied Surface Science , vol.188 , 301-305.
Özer, H., Atabak, M., Ellialtǧlu, R. M., & Oral, A., (2002). Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes. Applied Surface Science , vol.188, 301-305.
Özer, H.Özgür Et Al. "Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes," Applied Surface Science , vol.188, 301-305, 2002
Özer, H.Özgür Et Al. "Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes." Applied Surface Science , vol.188, pp.301-305, 2002
Özer, H. Et Al. (2002) . "Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes." Applied Surface Science , vol.188, pp.301-305.
@article{article, author={H.Özgür Özer Et Al. }, title={Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes}, journal={Applied Surface Science}, year=2002, pages={301-305} }