Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation

Yılmaz Ö. O., DEMİRKÖZ M. B., YALÇIN M. E.

The 39th Conference on Design of Circuits and Integrated Systems (DCIS 2024), Catania, Italy, 13 - 15 November 2024, (Full Text)

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/dcis62603.2024.10769157
  • City: Catania
  • Country: Italy
  • Middle East Technical University Affiliated: Yes