Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation | AVESİS

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Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation

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Yılmaz Ö. O., DEMİRKÖZ M. B., YALÇIN M. E.

The 39th Conference on Design of Circuits and Integrated Systems (DCIS 2024), Catania, Italy, 13 - 15 November 2024

Publication Type: Conference Paper / Full Text
Doi Number: 10.1109/dcis62603.2024.10769157
City: Catania
Country: Italy
Middle East Technical University Affiliated: Yes