Citation Formats
Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation
  • IEEE
  • ACM
  • APA
  • Chicago
  • MLA
  • Harvard
  • BibTeX

Ö. O. Yılmaz Et Al. , "Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation," The 39th Conference on Design of Circuits and Integrated Systems (DCIS 2024) , Catania, Italy, 2024

Yılmaz, Ö. O. Et Al. 2024. Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation. The 39th Conference on Design of Circuits and Integrated Systems (DCIS 2024) , (Catania, Italy).

Yılmaz, Ö. O., DEMİRKÖZ, M. B., & YALÇIN, M. E., (2024). Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation . The 39th Conference on Design of Circuits and Integrated Systems (DCIS 2024), Catania, Italy

Yılmaz, Özgür, MELAHAT BİLGE DEMİRKÖZ, And MÜŞTAK ERHAN YALÇIN. "Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation," The 39th Conference on Design of Circuits and Integrated Systems (DCIS 2024), Catania, Italy, 2024

Yılmaz, Özgür O. Et Al. "Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation." The 39th Conference on Design of Circuits and Integrated Systems (DCIS 2024) , Catania, Italy, 2024

Yılmaz, Ö. O. DEMİRKÖZ, M. B. And YALÇIN, M. E. (2024) . "Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation." The 39th Conference on Design of Circuits and Integrated Systems (DCIS 2024) , Catania, Italy.

@conferencepaper{conferencepaper, author={Özgür Ozan Yılmaz Et Al. }, title={Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation}, congress name={The 39th Conference on Design of Circuits and Integrated Systems (DCIS 2024)}, city={Catania}, country={Italy}, year={2024}}