Causal RL Prediction of Fine-Pitch Interconnects Using Neural Networks

Ünal H. S., DURGUN A. C.

33rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2024, Toronto, Kanada, 6 - 09 Ekim 2024 identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Doi Numarası: 10.1109/epeps61853.2024.10754313
  • Basıldığı Şehir: Toronto
  • Basıldığı Ülke: Kanada
  • Anahtar Kelimeler: causal RLGC parameters, fine pitch interconnect, neural network
  • Orta Doğu Teknik Üniversitesi Adresli: Evet

Özet

In this study, we compare physics-aware neural networks for modeling fine-pitch interconnects. Results show a 5-fold reduction in test loss when imposing DC resistance through analytical equations and preserving the causality relation between resistance and inductance.