COMPLETE TEST-GENERATION METHOD FOR ALL STUCK-AT FAULTS IN COMBINATIONAL-CIRCUITS

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GURAN H., HALICI U.

INTERNATIONAL JOURNAL OF ELECTRONICS, vol.68, no.5, pp.657-666, 1990 (SCI-Expanded)

• Publication Type: Article / Article
• Volume: 68 Issue: 5
• Publication Date: 1990
• Doi Number: 10.1080/00207219008921209
• Journal Name: INTERNATIONAL JOURNAL OF ELECTRONICS
• Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Page Numbers: pp.657-666
• Middle East Technical University Affiliated: Yes