GURAN, H. And HALICI, U. 1990. COMPLETE TEST-GENERATION METHOD FOR ALL STUCK-AT FAULTS IN COMBINATIONAL-CIRCUITS. INTERNATIONAL JOURNAL OF ELECTRONICS , vol.68, no.5 , 657-666.

GURAN, H., & HALICI, U., (1990). COMPLETE TEST-GENERATION METHOD FOR ALL STUCK-AT FAULTS IN COMBINATIONAL-CIRCUITS. INTERNATIONAL JOURNAL OF ELECTRONICS , vol.68, no.5, 657-666.

GURAN, H, And UĞUR HALICI. "COMPLETE TEST-GENERATION METHOD FOR ALL STUCK-AT FAULTS IN COMBINATIONAL-CIRCUITS," INTERNATIONAL JOURNAL OF ELECTRONICS , vol.68, no.5, 657-666, 1990

GURAN, H And HALICI, UĞUR. "COMPLETE TEST-GENERATION METHOD FOR ALL STUCK-AT FAULTS IN COMBINATIONAL-CIRCUITS." INTERNATIONAL JOURNAL OF ELECTRONICS , vol.68, no.5, pp.657-666, 1990

GURAN, H. And HALICI, U. (1990) . "COMPLETE TEST-GENERATION METHOD FOR ALL STUCK-AT FAULTS IN COMBINATIONAL-CIRCUITS." INTERNATIONAL JOURNAL OF ELECTRONICS , vol.68, no.5, pp.657-666.

@article{article, author={H GURAN And author={UĞUR HALICI}, title={COMPLETE TEST-GENERATION METHOD FOR ALL STUCK-AT FAULTS IN COMBINATIONAL-CIRCUITS}, journal={INTERNATIONAL JOURNAL OF ELECTRONICS}, year=1990, pages={657-666} }