Incidental Gold Losses in Leaching Circuits: A Review of Major Chemical/Electrochemical and Physical Mechanisms Causing Deficient Au Recoveries

ALTUN N. E., Kou J., Klein B., Chunbao S.

World Gold Conference, Shenyang, China, 4 - 07 September 2023, pp.769-780

  • Publication Type: Conference Paper / Full Text
  • City: Shenyang
  • Country: China
  • Page Numbers: pp.769-780
  • Middle East Technical University Affiliated: Yes