ALTUN, N. E. Et Al. 2023. Incidental Gold Losses in Leaching Circuits: A Review of Major Chemical/Electrochemical and Physical Mechanisms Causing Deficient Au Recoveries. World Gold Conference , (Shenyang, China), 769-780.

ALTUN, N. E., Kou, J., Klein, B., & Chunbao, S., (2023). Incidental Gold Losses in Leaching Circuits: A Review of Major Chemical/Electrochemical and Physical Mechanisms Causing Deficient Au Recoveries . World Gold Conference (pp.769-780). Shenyang, China

ALTUN, NACİ Et Al. "Incidental Gold Losses in Leaching Circuits: A Review of Major Chemical/Electrochemical and Physical Mechanisms Causing Deficient Au Recoveries," World Gold Conference, Shenyang, China, 2023

ALTUN, NACİ E. Et Al. "Incidental Gold Losses in Leaching Circuits: A Review of Major Chemical/Electrochemical and Physical Mechanisms Causing Deficient Au Recoveries." World Gold Conference , Shenyang, China, pp.769-780, 2023

ALTUN, N. E. Et Al. (2023) . "Incidental Gold Losses in Leaching Circuits: A Review of Major Chemical/Electrochemical and Physical Mechanisms Causing Deficient Au Recoveries." World Gold Conference , Shenyang, China, pp.769-780.

@conferencepaper{conferencepaper, author={NACİ EMRE ALTUN Et Al. }, title={Incidental Gold Losses in Leaching Circuits: A Review of Major Chemical/Electrochemical and Physical Mechanisms Causing Deficient Au Recoveries}, congress name={World Gold Conference}, city={Shenyang}, country={China}, year={2023}, pages={769-780} }