Development of SAMPLE Scanning High Speed AFM operating at 1,000 Lines/s 15µm x 15µm x 3µm


ÇELİK Ü., UYSALLI Y., KEHRİBAR İ., ÇELİK K., ÖZER H. Ö. , ORAL A.

The 19th InternationalScanning Probe Microscopy Conference KYOTO JAPAN, 17 - 19 Mayıs 2017