Development of SAMPLE Scanning High Speed AFM operating at 1,000 Lines/s 15µm x 15µm x 3µm | AVESİS

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Development of SAMPLE Scanning High Speed AFM operating at 1,000 Lines/s 15µm x 15µm x 3µm

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ÇELİK Ü., UYSALLI Y., KEHRİBAR İ., ÇELİK K., ÖZER H. Ö., ORAL A.

The 19th InternationalScanning Probe Microscopy Conference KYOTO JAPAN, 17 - 19 May 2017

Publication Type: Conference Paper / Summary Text
Middle East Technical University Affiliated: Yes