ÇELİK, Ü. Et Al. 2017. Development of SAMPLE Scanning High Speed AFM operating at 1,000 Lines/s 15µm x 15µm x 3µm. The 19th InternationalScanning Probe Microscopy Conference KYOTO JAPAN .

ÇELİK, Ü., UYSALLI, Y., KEHRİBAR, İ., ÇELİK, K., ÖZER, H. Ö., & ORAL, A., (2017). Development of SAMPLE Scanning High Speed AFM operating at 1,000 Lines/s 15µm x 15µm x 3µm . The 19th InternationalScanning Probe Microscopy Conference KYOTO JAPAN

ÇELİK, ÜMİT Et Al. "Development of SAMPLE Scanning High Speed AFM operating at 1,000 Lines/s 15µm x 15µm x 3µm," The 19th InternationalScanning Probe Microscopy Conference KYOTO JAPAN, 2017

ÇELİK, ÜMİT Et Al. "Development of SAMPLE Scanning High Speed AFM operating at 1,000 Lines/s 15µm x 15µm x 3µm." The 19th InternationalScanning Probe Microscopy Conference KYOTO JAPAN , 2017

ÇELİK, Ü. Et Al. (2017) . "Development of SAMPLE Scanning High Speed AFM operating at 1,000 Lines/s 15µm x 15µm x 3µm." The 19th InternationalScanning Probe Microscopy Conference KYOTO JAPAN .

@conferencepaper{conferencepaper, author={ÜMİT ÇELİK Et Al. }, title={Development of SAMPLE Scanning High Speed AFM operating at 1,000 Lines/s 15µm x 15µm x 3µm}, congress name={The 19th InternationalScanning Probe Microscopy Conference KYOTO JAPAN}, city={}, country={}, year={2017}}