Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback

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Dede M., Urkmen K., ORAL A., Farrer I., Ritchie D.

INTERMAG 2006 - IEEE International Magnetics Conference, San Diego, CA, United States Of America, 8 - 12 May 2006, pp.584

• Publication Type: Conference Paper / Full Text
• Doi Number: 10.1109/intmag.2006.376308
• City: San Diego, CA
• Country: United States Of America
• Page Numbers: pp.584
• Middle East Technical University Affiliated: No