Dede, M. Et Al. 2006. Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback. INTERMAG 2006 - IEEE International Magnetics Conference , (San Diego, CA, United States Of America), 584.

Dede, M., Urkmen, K., ORAL, A., Farrer, I., & Ritchie, D., (2006). Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback . INTERMAG 2006 - IEEE International Magnetics Conference (pp.584). San Diego, CA, United States Of America

Dede, M. Et Al. "Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback," INTERMAG 2006 - IEEE International Magnetics Conference, San Diego, CA, United States Of America, 2006

Dede, M. Et Al. "Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback." INTERMAG 2006 - IEEE International Magnetics Conference , San Diego, CA, United States Of America, pp.584, 2006

Dede, M. Et Al. (2006) . "Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback." INTERMAG 2006 - IEEE International Magnetics Conference , San Diego, CA, United States Of America, p.584.

@conferencepaper{conferencepaper, author={M. Dede Et Al. }, title={Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback}, congress name={INTERMAG 2006 - IEEE International Magnetics Conference}, city={San Diego, CA}, country={United States Of America}, year={2006}, pages={584} }