Akademik Veri Yönetim Sistemi
Tezin Türü: Yüksek Lisans
Tezin Yürütüldüğü Kurum: İhsan Doğramacı Bilkent Üniversitesi, Malzeme Bilimi Ve Nanoteknoloji Enstitüsü, Malzeme Bilimi ve Nanoteknoloji, Türkiye
Tezin Onay Tarihi: 2010
Tezin Dili: İngilizce
Öğrenci: Mustafa Ürel
Asıl Danışman (Eş Danışmanlı Tezler İçin): Salim Çıracı
Eş Danışman: Muhsine Bilge İmer, Aykutlu Dana
Özet:
In this work, we propose methods for electrical characterization of nanostructured
surfaces using electrostatic force and tunneling current measurements in
scanning probe microscopy. Resolution smaller than 10 nm in electrostatic force
microscopy (EFM) is attained and reasons for this attainment is explained in
terms of the tip-sample capacitance and mechanical vibrations of tip design. Dynamic
measurements are done in EFM using a lumped model for tip-sample
electrostatic interaction instead of a simple tip-sample capacitance model. Surface
photovoltage measurements are done and assured in EFM using frequency
response techniques. Also, combining tunneling current measurements by EFM
measurements, optoelectonic properties of graphene/graphene oxide samples are
characterized.