Metamaterial absorber-based sensor embedded into X-band waveguide

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SABAH C., TURKMEN-KUCUKSARİ O., Turhan-Sayan G.

ELECTRONICS LETTERS, cilt.50, sa.15, ss.1075-1076, 2014 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 50 Sayı: 15
  • Basım Tarihi: 2014
  • Doi Numarası: 10.1049/el.2014.1753
  • Dergi Adı: ELECTRONICS LETTERS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.1075-1076
  • Orta Doğu Teknik Üniversitesi Adresli: Evet

Özet

A novel metamaterial sensor, integrated with an X-band waveguide, is proposed for high-resolution measurements of variations in the dielectric constant and/or the thickness of a superstrate layer that covers a pair of absorber unit cells. Variations in superstrate parameters are potentially caused by physical, chemical or biological factors, and can be detected by measuring the corresponding shifts in the resonance frequency of the metamaterial sensor. It is estimated by simulation results that resolution levels as good as 1.1 mu m change in thickness or 0.023 absolute change in relative permittivity of the sensing layer are feasible for a 10 MHz measurable shift in resonance frequency. Simulation results obtained for the fabricated prototype are verified experimentally with good agreement.