SOLID STATE COMMUNICATIONS, vol.87, no.12, pp.1129-1131, 1993 (SCI-Expanded)
(Bi,Pb)2Sr2Ca2Cu3O10 high T(c) superconducting samples were subject to irradiation by 7 MeV Si ions. X-ray diffraction analysis showed that the intensity of the (00l) peaks decrease rapidly with ion irradiation, while that of the mixed index peaks (hkl) changes very little. The a-parameter decreases first then increases with ion fluence while the c-parameter increase continuously with ion irradiation.