Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 × 1)

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Özer H. Ö., Atabak M., ORAL A.

Solid State Communications, vol.124, no.12, pp.469-472, 2002 (SCI-Expanded) identifier

  • Publication Type: Article / Abstract
  • Volume: 124 Issue: 12
  • Publication Date: 2002
  • Doi Number: 10.1016/s0038-1098(02)00547-1
  • Journal Name: Solid State Communications
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.469-472
  • Keywords: A. Si (100) surface, E. nc-AFM/STM studies
  • Middle East Technical University Affiliated: No


Si(100)(2 × 1) surface is imaged using a new nc-AFM (non-contact atomic force microscopy)/STM with sub-Ångstrom oscillation amplitudes using stiff hand-made tungsten levers. Simultaneous force gradient and scanning tunneling microscopy images of individual dimers and atomic scale defects are obtained. We measured force-distance and dissipation-distance curves with different tips. Some of the tips show long-range force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM. We also observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. © 2002 Elsevier Science Ltd. All rights reserved.