Room temperature scanning micro-Hall probe microscopy under extremely large pulsed magnetic fields


Sandhu A., Masuda H., ORAL A.

2003 IEEE International Magnetics Conference, Intermag 2003, Massachusetts, United States Of America, 30 March - 03 April 2003 identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/intmag.2003.1230675
  • City: Massachusetts
  • Country: United States Of America
  • Keywords: Ambient intelligence, Atomic force microscopy, Hall effect devices, Magnetic field measurement, Magnetic fields, Magnetic force microscopy, Probes, Pulse measurements, Temperature, Vibration measurement

Abstract

© 2003 IEEE.In this paper, we describe the use of pulsed magnetic field as a well established method for producing extremely large fields but the integration of pulse coils and peripheral instrumentation with the RT-SHPM necessitates extreme care due to the adverse effects of external vibrations during continuous magnetic imaging measurements.