Room temperature scanning micro-Hall probe microscopy under extremely large pulsed magnetic fields

Sandhu A., Masuda H., ORAL A.

2003 IEEE International Magnetics Conference, Intermag 2003, Massachusetts, Amerika Birleşik Devletleri, 30 Mart - 03 Nisan 2003 identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Doi Numarası: 10.1109/intmag.2003.1230675
  • Basıldığı Şehir: Massachusetts
  • Basıldığı Ülke: Amerika Birleşik Devletleri
  • Anahtar Kelimeler: Ambient intelligence, Atomic force microscopy, Hall effect devices, Magnetic field measurement, Magnetic fields, Magnetic force microscopy, Probes, Pulse measurements, Temperature, Vibration measurement
  • Orta Doğu Teknik Üniversitesi Adresli: Hayır

Özet

© 2003 IEEE.In this paper, we describe the use of pulsed magnetic field as a well established method for producing extremely large fields but the integration of pulse coils and peripheral instrumentation with the RT-SHPM necessitates extreme care due to the adverse effects of external vibrations during continuous magnetic imaging measurements.