Exploring Temperature-Dependent bandgap and Urbach energies in CdTe thin films for optoelectronic applications
Materials Letters, vol.373, 2024 (SCI-Expanded, Scopus)
- Publication Type: Article / Article
- Volume: 373
- Publication Date: 2024
- Doi Number: 10.1016/j.matlet.2024.137078
- Journal Name: Materials Letters
- Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Chemical Abstracts Core, Chimica, Communication Abstracts, Compendex, INSPEC, Metadex, Civil Engineering Abstracts
- Keywords: Optical materials and properties, Solar energy materials, Sputtering, Thin Films
- Middle East Technical University Affiliated: Yes
Abstract
This study examines CdTe thin films deposited via RF magnetron sputtering, focusing on structural and optical properties. X-ray diffraction, Raman spectroscopy, and SEM assessed structural characteristics. Optical properties were analyzed through transmittance measurements from 10 to 300 K. Tauc plots and Varshni modeling revealed a temperature-dependent bandgap, increasing from 1.49 eV at room temperature to 1.57 eV at 10 K. Urbach energy rose from 82.7 to 93.7 meV with temperature. These results are essential for applications where temperature affects CdTe-based device performance.