Physical Realization and Reflection Phase Characteristics of a Flexible High Impedance Surface

Durgun A. C. , Balanis C. A. , Birtcher C. R.

IEEE International Symposium on Antennas and Propagation (APSURSI)/USNC/URSI National Radio Science Meeting, Washington, United States Of America, 3 - 08 July 2011, pp.1844-1847 identifier identifier

  • Publication Type: Conference Paper / Full Text
  • Volume:
  • Doi Number: 10.1109/aps.2011.5996856
  • City: Washington
  • Country: United States Of America
  • Page Numbers: pp.1844-1847
  • Middle East Technical University Affiliated: No


This paper presents the fabrication and reflection phase measurements of a flexible high impedance surface (FHIS). The surface is fabricated by using DuPont pyralux polyimide as the substrate. Cyanoacrylate is used to adhere the samples of polyimide. The reflection phase response of the FHIS, which is curved in the form of a cylinder, is measured in the anechoic chamber and compared with that of the flat FHIS. As expected, reflection phase characteristics of the curved FHIS are polarization dependent and slightly different than those of the flat one. The measured reflection phase characteristics of the curved FHIS will be compared with simulations which presently are under consideration.