Investigation of on-wafer TRL calibration accuracy dependence on transitions and probe positioning


Atasoy H., Unlu M., Topalli K., Istanbulluoglu I., Temocin E., Bayraktar O., ...More

36th European Microwave Conference, EuMC 2006, Manchester, United Kingdom, 10 - 12 September 2006, pp.1582-1585 identifier identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/eumc.2006.281401
  • City: Manchester
  • Country: United Kingdom
  • Page Numbers: pp.1582-1585