SHALLOW IMPURITIES IN HETEROJUNCTIONS


ELKAWNI M., TOMAK M.

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, vol.53, no.2, pp.305-308, 1992 (SCI-Expanded) identifier identifier

Abstract

The shallow impurity states in Si/SiO2 and GaAs/Ga1-xAlxAs heterojunctions are studied variationally using an improved Fang-Howard trial wave function originally proposed for the Si/SiO2 system.