Scan-line quality inspection of strip materials using 1-D radial basis function network
1st International Conference on Computer Vision Theory and Applications, Setubal, Portugal, 25 - 28 February 2006, pp.19-26, (Full Text)
- Publication Type: Conference Paper / Full Text
- City: Setubal
- Country: Portugal
- Page Numbers: pp.19-26
- Middle East Technical University Affiliated: Yes
Abstract
There exist a variety of manufacturing quality inspection tasks where the inspection of a continuous strip of material using a scan-line camera is involved. Here the image is very short in one dimension but unlimited in the other dimension. In this study, a method of image event detection for this class of applications based on adaptive radial-basis function networks is presented. The architecture of the system and the adaptation methodology is presented in detail together with a detailed discussion on parameter selection. Promising detection results are illustrated for an application to grinded glass edge inspection problem.