Preparation and microstructural characterization of oriented titanosilicate ETS-10 thin films on indium tin oxide surfaces

Galioglu S., Ismail M. N. , Warzywoda J., Sacco A., AKATA KURÇ B.

MICROPOROUS AND MESOPOROUS MATERIALS, cilt.131, ss.401-406, 2010 (SCI İndekslerine Giren Dergi) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 131
  • Basım Tarihi: 2010
  • Doi Numarası: 10.1016/j.micromeso.2010.02.001
  • Sayfa Sayıları: ss.401-406


Oriented polycrystalline ETS-10 thin films (average thickness similar to 1.50-1.75 mu m) were prepared on the ITO glass substrates using secondary growth of ETS-10 multilayers with a partial a(b)-out-of-plane preferred crystal orientation. After secondary growth, the films showed a columnar grain microstructure, and a significantly increased degree of a(b)-out-of-plane orientation. This orientation is desirable for advanced applications of ETS-10 films. The prepared films were strongly attached to the ITO glass substrates as evidenced by the absence of discernible differences in the substrate coverage with film after a 60-min ultrasonication in water. (C) 2010 Elsevier Inc. All rights reserved.