Preparation and microstructural characterization of oriented titanosilicate ETS-10 thin films on indium tin oxide surfaces


Galioglu S., Ismail M. N. , Warzywoda J., Sacco A., AKATA KURÇ B.

MICROPOROUS AND MESOPOROUS MATERIALS, vol.131, pp.401-406, 2010 (Peer-Reviewed Journal) identifier identifier

  • Publication Type: Article / Article
  • Volume: 131
  • Publication Date: 2010
  • Doi Number: 10.1016/j.micromeso.2010.02.001
  • Journal Name: MICROPOROUS AND MESOPOROUS MATERIALS
  • Journal Indexes: Science Citation Index Expanded, Scopus
  • Page Numbers: pp.401-406
  • Keywords: ETS-10, Titanosilicates, Indium tin oxide, Secondary growth, Thin films, PHOTOCATALYTIC ACTIVITIES, ZEOLITE CRYSTALS, MOLECULAR-SIEVES, MEMBRANES, NANOPARTICLES, GROWTH, GOLD, SIZE

Abstract

Oriented polycrystalline ETS-10 thin films (average thickness similar to 1.50-1.75 mu m) were prepared on the ITO glass substrates using secondary growth of ETS-10 multilayers with a partial a(b)-out-of-plane preferred crystal orientation. After secondary growth, the films showed a columnar grain microstructure, and a significantly increased degree of a(b)-out-of-plane orientation. This orientation is desirable for advanced applications of ETS-10 films. The prepared films were strongly attached to the ITO glass substrates as evidenced by the absence of discernible differences in the substrate coverage with film after a 60-min ultrasonication in water. (C) 2010 Elsevier Inc. All rights reserved.