QUADRUPLET SELECTION METHODS FOR DEEP EMBEDDING LEARNING


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Karaman K., Gundogdu E., Koc A., ALATAN A. A.

26th IEEE International Conference on Image Processing (ICIP), Taipei, Tayvan, 22 - 25 Eylül 2019, ss.3452-3456 identifier identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası:
  • Doi Numarası: 10.1109/icip.2019.8803401
  • Basıldığı Şehir: Taipei
  • Basıldığı Ülke: Tayvan
  • Sayfa Sayıları: ss.3452-3456
  • Anahtar Kelimeler: Deep distance metric learning, embedding learning, fine-grained classification/recognition
  • Orta Doğu Teknik Üniversitesi Adresli: Evet

Özet

Recognition of objects with subtle differences has been used in many practical applications, such as car model recognition and maritime vessel identification. For discrimination of the objects in fine-grained detail, we focus on deep embedding learning by using a multi-task learning framework, in which the hierarchical labels (coarse and fine labels) of the samples are utilized both for classification and a quadruplet-based loss function. In order to improve the recognition strength of the learned features, we present a novel feature selection method specifically designed for four training samples of a quadruplet. By experiments, it is observed that the selection of very hard negative samples with relatively easy positive ones from the same coarse and fine classes significantly increases some performance metrics in a fine-grained dataset when compared to selecting the quadruplet samples randomly. The feature embedding learned by the proposed method achieves favorable performance against its state-of-the-art counterparts.