A linear temperature controller and a cryostat have been developed to measure thermally stimulated current (TSC) in CdS, a-Si:H and CdTe in order to determine the trapping characteristic. In this paper, the temperature controller and the cryostat are described in detail. In addition, TSC spectra, at five different heating rates, for a CdS thin-film sample recorded with the developed system are given, The system controls the linear heating of a sample at temperatures between about 100 K and 373 K. The temperature controller is based on an Intel 8052 microprocessor which contains a full BASIC interpreter. The monitor program of the controller is developed through a BASIC emulator, and is stored on an EPROM. For performance testing of the system, the temperatures on the experimental area are monitored during heating. The deviations from linearity were measured to be only 0.01 K s-1 for slow heating rates.