In situ Measurements of Irradiation-Induced Creep of Nanocrystalline Copper at Elevated Temperatures

ÖZERİNÇ S., AVERBACK R. S., KING W. P.

JOM, vol.68, no.11, pp.2737-2741, 2016 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 68 Issue: 11
  • Publication Date: 2016
  • Doi Number: 10.1007/s11837-016-2077-9
  • Journal Name: JOM
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.2737-2741
  • Middle East Technical University Affiliated: Yes

Abstract

We have measured irradiation-induced creep on nanocrystalline copper micropillars at elevated temperatures. The micropillars, which were approximate to 1 mu m in diameter and approximate to 2 mu m in height, were fabricated from magnetron-sputtered nanocrystalline copper films. The micropillars were compressed during 2.0 MeV Ar+ bombardment and the deformation measured in situ by laser interferometry. The creep rate was measured over the stress range 10-120 MPa at approximate to 200 degrees C. The results show linear relationships of creep rate with both applied stress and displacement rate, yielding a creep compliance of 0.07 dpa(-1) GPa(-1) (dpa:displacement per atom). The findings are in good agreement with the previous results obtained using a bulge test on free-standing thin film specimens.