Measurement of energy dissipation between tungsten tip and Si(1 0 0)-( 2 × 1 ) using sub-Ångström oscillation amplitude non-contact atomic force microscope


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Özer H. Ö. , Atabak M., Oral A.

Applied Surface Science, vol.210, pp.12-17, 2003 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 210
  • Publication Date: 2003
  • Doi Number: 10.1016/s0169-4332(02)01472-1
  • Journal Name: Applied Surface Science
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.12-17
  • Keywords: non-contact atomic force microscopy, small oscillation amplitudes, Si(100)-(2 x 1), force-distance spectroscopy, dissipation-distance spectroscopy, short-range forces, atomic scale dissipation, SAMPLE INTERACTION, SURFACE, SPECTROSCOPY
  • Middle East Technical University Affiliated: No

Abstract

Energy dissipation plays an important role in non-contact atomic force microscopy (nc-AFM), atomic manipulation and friction. In this work, we studied atomic scale energy dissipation between a tungsten tip and Si(1 0 0)-(2 x 1) surface. Dissipation measurements are performed with a high sensitivity nc-AFM using sub-Angstrom oscillation amplitudes below resonance. We observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. This dissipation is most probably due to transformation of the kinetic energy of the tip into phonons and heat. (C) 2003 Elsevier Science B.V. All rights reserved.