Measurement of energy dissipation between tungsten tip and Si(1 0 0)-( 2 × 1 ) using sub-Ångström oscillation amplitude non-contact atomic force microscope

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Özer H. Ö., Atabak M., Oral A.

Applied Surface Science, cilt.210, ss.12-17, 2003 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 210
  • Basım Tarihi: 2003
  • Doi Numarası: 10.1016/s0169-4332(02)01472-1
  • Dergi Adı: Applied Surface Science
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.12-17
  • Anahtar Kelimeler: non-contact atomic force microscopy, small oscillation amplitudes, Si(100)-(2 x 1), force-distance spectroscopy, dissipation-distance spectroscopy, short-range forces, atomic scale dissipation, SAMPLE INTERACTION, SURFACE, SPECTROSCOPY
  • Orta Doğu Teknik Üniversitesi Adresli: Hayır

Özet

Energy dissipation plays an important role in non-contact atomic force microscopy (nc-AFM), atomic manipulation and friction. In this work, we studied atomic scale energy dissipation between a tungsten tip and Si(1 0 0)-(2 x 1) surface. Dissipation measurements are performed with a high sensitivity nc-AFM using sub-Angstrom oscillation amplitudes below resonance. We observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. This dissipation is most probably due to transformation of the kinetic energy of the tip into phonons and heat. (C) 2003 Elsevier Science B.V. All rights reserved.