Sensitization of the 1.54μm Er emission in Amorphous Silicon Nitride Films | AVESİS

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Sensitization of the 1.54μm Er emission in Amorphous Silicon Nitride Films

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Yerci S., Li R., Basu S. N., Negro L. D.

2009 6th IEEE International Conference on Group IV Photonics, GFP '09, San Francisco, CA, United States Of America, 9 - 11 September 2009, pp.52-54

Publication Type: Conference Paper / Full Text
Doi Number: 10.1109/group4.2009.5338293
City: San Francisco, CA
Country: United States Of America
Page Numbers: pp.52-54
Middle East Technical University Affiliated: Yes