Linear measurements of nanomechanical phenomena using small-amplitude AFM

Hoffmann P. M., Patil S., Matei G., Tanulku A., Grimble R., Özer H. Ö., ...Daha Fazla

2004 MRS Fall Meeting, Boston, MA, Amerika Birleşik Devletleri, 29 Kasım - 03 Aralık 2004, cilt.838, ss.7-12, (Tam Metin Bildiri) identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası: 838
  • Doi Numarası: 10.1557/proc-838-o1.8
  • Basıldığı Şehir: Boston, MA
  • Basıldığı Ülke: Amerika Birleşik Devletleri
  • Sayfa Sayıları: ss.7-12
  • Orta Doğu Teknik Üniversitesi Adresli: Hayır

Özet

Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water. © 2005 Materials Research Society.