Linear measurements of nanomechanical phenomena using small-amplitude AFM


Hoffmann P. M. , Patil S., Matei G., Tanulku A., Grimble R., Özer H. Ö. , ...More

2004 MRS Fall Meeting, Boston, MA, United States Of America, 29 November - 03 December 2004, vol.838, pp.7-12 identifier

  • Publication Type: Conference Paper / Full Text
  • Volume: 838
  • Doi Number: 10.1557/proc-838-o1.8
  • City: Boston, MA
  • Country: United States Of America
  • Page Numbers: pp.7-12

Abstract

Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water. © 2005 Materials Research Society.