Linear measurements of nanomechanical phenomena using small-amplitude AFM

Hoffmann P. M., Patil S., Matei G., Tanulku A., Grimble R., Özer H. Ö., ...More

2004 MRS Fall Meeting, Boston, MA, United States Of America, 29 November - 03 December 2004, vol.838, pp.7-12 identifier

  • Publication Type: Conference Paper / Full Text
  • Volume: 838
  • Doi Number: 10.1557/proc-838-o1.8
  • City: Boston, MA
  • Country: United States Of America
  • Page Numbers: pp.7-12
  • Middle East Technical University Affiliated: No


Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water. © 2005 Materials Research Society.