PVD growth and characterization of YBCO thin films on polycrystalline alumina substrates: phase separation


Ozenbas M. , Gungoren T.

PHYSICA C, vol.341, pp.2363-2364, 2000 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 341
  • Publication Date: 2000
  • Doi Number: 10.1016/s0921-4534(00)01256-9
  • Title of Journal : PHYSICA C
  • Page Numbers: pp.2363-2364

Abstract

In this study, high T-c superconducting thin films of Y-Ba-Cu-O system have been prepared onto polycrystalline alpha -Al2O3 substrates by resistive evaporation of YF3, BaF2, and Cu powders and a subsequent multi-stage annealing. In the deposition process, two different methods were used: mixed-powder method and sequential-deposition method. The best quality films were achieved on alpha -Al2O3 substrates by using sequential-deposition technique with offset critical transition temperature of 80.6 K. Sequential deposition method seems to reduce film-substrate reactions on alpha -Al2O3 substrates, probably due in part to the prevention of phase separation.