MATERIALS RESEARCH BULLETIN, vol.38, no.4, pp.699-704, 2003 (SCI-Expanded)
Article / Article
MATERIALS RESEARCH BULLETIN
Science Citation Index Expanded (SCI-EXPANDED), Scopus
semiconductors, chalcogenides, defects, electrical properties
Middle East Technical University Affiliated:
Thermally stimulated current measurements are carried out on as-grown n-InS single crystals in the temperature range of 10-125 K. Experimental evidence is found for four trapping centers present in InS. They are located at 20, 35, 60 and 130 meV. The trap parameters have been determined by various methods of analysis, and they agree well with each other. (C) 2002 Elsevier Science Ltd. All rights reserved.