Mass spectrometry as a tool in dendrimer chemistry: from self-assembling dendrimers to dendrimer gas-phase host-guest chemistry

Schalley C. A., Baytekin B., Baytekin H. T., Engeser M., Felder T., Rang A.

JOURNAL OF PHYSICAL ORGANIC CHEMISTRY, cilt.19, sa.8-9, ss.479-490, 2006 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 19 Sayı: 8-9
  • Basım Tarihi: 2006
  • Doi Numarası: 10.1002/poc.1105
  • Dergi Adı: JOURNAL OF PHYSICAL ORGANIC CHEMISTRY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.479-490
  • Anahtar Kelimeler: supramolecular chemistry, mass spectrometry, gas-phase chemistry, dendrimers, self-assembly, molecular tweezers, defects, fragmentation mechanisms, dendritic effects, ASSISTED-LASER-DESORPTION/IONIZATION, POLY(PROPYLENE IMINE) DENDRIMERS, SUPRAMOLECULAR CHEMISTRY, MOLECULAR RECOGNITION, POLYMERS, SQUARES, FULLERODENDRIMERS, ENCAPSULATION, TETRANUCLEAR, COMPLEXES
  • Orta Doğu Teknik Üniversitesi Adresli: Hayır

Özet

Mass spectrometry has played a significant role in dendrimer chemistry, because it serves as an excellent analytical means to determine the purity and analyze the nature of defects even for higher generations. However, a mass spectrometer can also be used as a laboratory to study isolated dendrimer molecules in the gas phase or their host-guest complexes. Since the properties of molecules under environment-free conditions are often quite different from those in solution, their gas-phase chemistry provides valuable new insight into properties which cannot easily be studied in solution. This article summarizes some of our work on characterizing self-assembling metallo-supramolecular dendrimers, on analyzing ionization artifacts, on the differentiation between several, sometimes even isomeric defects through tandem MS experiments, and finally on the analysis of a surprisingly clear dendritic effect occurring in the fragmentation of dendritic host-guest complexes. Copyright (c) 2006 John Wiley & Sons, Ltd.