Band alignment measurements of ZnOx/Si , MoOX/Si interfaces by ultraviolet photoelectron spectroscopy for heterojunction silicon

YILDIZ İ. , NASER H., BEKTAŞ G., TURAN R. , YERCİ S.

E-MRS FALL, Warszawa, Poland, 17 - 21 September 2017

  • Publication Type: Conference Paper / Summary Text
  • City: Warszawa
  • Country: Poland