Plane Wave Scattering from a Curved HIS: Normal Incidence

Durgun A. C. , Balanis C. A. , Birtcher C. R.

IEEE International Symposium on Antennas and Propagation, Illinois, United States Of America, 8 - 14 July 2012 identifier identifier

  • Publication Type: Conference Paper / Full Text
  • Volume:
  • Doi Number: 10.1109/aps.2012.6348843
  • City: Illinois
  • Country: United States Of America


An approximate analytical method is developed to characterize the reflection properties of a cylindrically curved high impedance surface (HIS). This method assumes a homogenized model for the curved HIS which can be extracted from the reflection properties of the flat HIS. In this work, only the normal incidence case is considered for TEz and TMz polarizations.