IEEE International Symposium on Antennas and Propagation, Illinois, Amerika Birleşik Devletleri, 8 - 14 Temmuz 2012
An approximate analytical method is developed to characterize the reflection properties of a cylindrically curved high impedance surface (HIS). This method assumes a homogenized model for the curved HIS which can be extracted from the reflection properties of the flat HIS. In this work, only the normal incidence case is considered for TEz and TMz polarizations.