Electron-phonon scattering in metallic single-walled carbon nanotubes


Park J., Rosenblatt S., Yaish Y., Sazonova V., Ustunel H., Braig S., ...More

NANO LETTERS, vol.4, no.3, pp.517-520, 2004 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 4 Issue: 3
  • Publication Date: 2004
  • Doi Number: 10.1021/nl035258c
  • Journal Name: NANO LETTERS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.517-520
  • Middle East Technical University Affiliated: Yes

Abstract

Electron scattering rates in metallic single-walled carbon nanotubes are studied using an atomic force microscope as an electrical probe. From the scaling of the resistance of the same nanotube with length in the low- and high-bias regimes, the mean-free paths for both regimes are inferred. The observed scattering rates are consistent with calculations for acoustic-phonon scattering at low biases and zone boundary/optical phonon scattering at high biases.