A variational multiscale constitutive model for nanocrystalline materials


GÜRSES E. , EL SAYED T.

JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS, vol.59, no.3, pp.732-749, 2011 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 59 Issue: 3
  • Publication Date: 2011
  • Doi Number: 10.1016/j.jmps.2010.10.010
  • Title of Journal : JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS
  • Page Numbers: pp.732-749
  • Keywords: Variational updates, Nanocrystals, Voids, Crystal plasticity, Grain size, GRAIN-SIZE DEPENDENCE, STRAIN-RATE SENSITIVITY, MOLECULAR-DYNAMICS SIMULATION, HALL-PETCH RELATIONSHIP, PLASTIC-DEFORMATION, MECHANICAL-BEHAVIOR, YIELD-STRESS, NANOSTRUCTURED MATERIALS, POLYCRYSTALLINE METALS, INELASTIC DEFORMATION

Abstract

This paper presents a variational multi-scale constitutive model in the finite deformation regime capable of capturing the mechanical behavior of nanocrystalline (nc) fcc metals. The nc-material is modeled as a two-phase material consisting of a grain interior phase and a grain boundary effected zone (GBAZ). A rate-independent isotropic porous plasticity model is employed to describe the GBAZ, whereas a crystal-plasticity model which accounts for the transition from partial dislocation to full dislocation mediated plasticity is employed for the grain interior. The constitutive models of both phases are formulated in a small strain framework and extended to finite deformation by use of logarithmic and exponential mappings. Assuming the rule of mixtures, the overall behavior of a given grain is obtained via volume averaging. The scale transition from a single grain to a polycrystal is achieved by Taylor-type homogenization where a log-normal grain size distribution is assumed. It is shown that the proposed model is able to capture the inverse Hall-Perch effect, i.e., loss of strength with grain size refinement. Finally, the predictive capability of the model is validated against experimental results on nanocrystalline copper and nickel. (C) 2010 Elsevier Ltd. All rights reserved.