Escape of photoelectrons and Compton-scattered photons from an HPGe detector

Can C.

X-RAY SPECTROMETRY, cilt.32, sa.4, ss.280-284, 2003 (SCI İndekslerine Giren Dergi) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 32 Konu: 4
  • Basım Tarihi: 2003
  • Doi Numarası: 10.1002/xrs.650
  • Sayfa Sayıları: ss.280-284


The response function of a planar HPGe detector due to escape of photoelectrons and Compton-scattered photons was studied for a point source with 59.5 keV energy. It was shown that both mechanisms, in addition to Ge x-ray escape, leading to partial deposition of energy, could be observed in the same experiment. A Monte Carlo program was used to investigate these components of the response function. The results indicate that although the escape of scattered photons and Ge x-rays are of the same magnitude, the escape of photoelectrons plays a more important role in the efficiency of a detector. Copyright (C) 2003 John Wiley Sons, Ltd.