Escape of photoelectrons and Compton-scattered photons from an HPGe detector


Can C.

X-RAY SPECTROMETRY, vol.32, no.4, pp.280-284, 2003 (Peer-Reviewed Journal) identifier identifier

  • Publication Type: Article / Article
  • Volume: 32 Issue: 4
  • Publication Date: 2003
  • Doi Number: 10.1002/xrs.650
  • Journal Name: X-RAY SPECTROMETRY
  • Journal Indexes: Science Citation Index Expanded, Scopus
  • Page Numbers: pp.280-284

Abstract

The response function of a planar HPGe detector due to escape of photoelectrons and Compton-scattered photons was studied for a point source with 59.5 keV energy. It was shown that both mechanisms, in addition to Ge x-ray escape, leading to partial deposition of energy, could be observed in the same experiment. A Monte Carlo program was used to investigate these components of the response function. The results indicate that although the escape of scattered photons and Ge x-rays are of the same magnitude, the escape of photoelectrons plays a more important role in the efficiency of a detector. Copyright (C) 2003 John Wiley Sons, Ltd.