Escape of photoelectrons and Compton-scattered photons from an HPGe detector
X-RAY SPECTROMETRY, cilt.32, sa.4, ss.280-284, 2003 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 32 Sayı: 4
- Basım Tarihi: 2003
- Doi Numarası: 10.1002/xrs.650
- Dergi Adı: X-RAY SPECTROMETRY
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.280-284
- Orta Doğu Teknik Üniversitesi Adresli: Hayır
Özet
The response function of a planar HPGe detector due to escape of photoelectrons and Compton-scattered photons was studied for a point source with 59.5 keV energy. It was shown that both mechanisms, in addition to Ge x-ray escape, leading to partial deposition of energy, could be observed in the same experiment. A Monte Carlo program was used to investigate these components of the response function. The results indicate that although the escape of scattered photons and Ge x-rays are of the same magnitude, the escape of photoelectrons plays a more important role in the efficiency of a detector. Copyright (C) 2003 John Wiley Sons, Ltd.