Real-time scanning hall probe microscopy


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Oral A. , BENDİNG S. J. , HENİNİ M.

APPLIED PHYSICS LETTERS, vol.69, no.9, pp.1324-1326, 1996 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 69 Issue: 9
  • Publication Date: 1996
  • Doi Number: 10.1063/1.117582
  • Title of Journal : APPLIED PHYSICS LETTERS
  • Page Numbers: pp.1324-1326

Abstract

We describe a low-noise scanning Hall probe microscope having unprecedented magnetic field sensitivity (similar to 2.9x10(-8) T/root Hz at 77 K), high spatial resolution, (similar to 0.85 mu m),nd operating in real-time (similar to 1 frame/s) for studying flux profiles at surfaces. A submicron Hall probe manufactured in a GaAs/A1GaAs two-dimensional electron gas (2DEG) is scanned over the sample to measure the surface magnetic fields using conventional scanning tunneling microscopy positioning techniques. Flux penetration into a high T-c YBa2Cu3O7-delta thin film has been observed in real time at 85 K with single vortex resolution. Flux is seen to enter the film in the form of vortex bundles as well as single flux quanta, Phi(0). (C) 1996 American Institute of Physics.