Photoelectron, compton and characteristic x-ray escape from an HPGe detector in the range 8-52 keV

Yilmaz E., Can C.

X-RAY SPECTROMETRY, cilt.33, sa.6, ss.439-446, 2004 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 33 Sayı: 6
  • Basım Tarihi: 2004
  • Doi Numarası: 10.1002/xrs.746
  • Dergi Adı: X-RAY SPECTROMETRY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.439-446
  • Orta Doğu Teknik Üniversitesi Adresli: Hayır

Özet

Escape of photoelectrons, Compton-scattered photons and Ge x-rays from an HPGe detector was studied as a function of energy in the range 8-52 keV. A variable-energy source producing Cu, Rb, Mo, Ag, Ba. and Tb x-rays was used. All three mechanisms for energy loss were observed in the same experiment for Ba and Tb, while only x-ray and photoelectron escapes were evident in the spectra for Ag, Mo, Rb, and Cu. Spectral features and possible mechanisms for partial energy deposition were investigated. A Monte Carlo program was used to simulate the relevant interactions, and to estimate the escape probabilities. Copyright (C) 2004 John Wiley Sons, Ltd.