XPS and in-situ IR investigation of Ru/SiO2 catalyst


Sayan S., Suzer S., Uner D.

JOURNAL OF MOLECULAR STRUCTURE, cilt.410, ss.111-114, 1997 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 410
  • Basım Tarihi: 1997
  • Doi Numarası: 10.1016/s0022-2860(96)09637-8
  • Dergi Adı: JOURNAL OF MOLECULAR STRUCTURE
  • Sayfa Sayıları: ss.111-114

Özet

Ru(NO)(NO3)(3)/SiO2 catalyst precursors were characterized via XPS and in-situ reflectance IR spectroscopy before, during and after reduction by hydrogen over the temperature range 300-800 K. IR results indicated that the catalyst precursor lost NO3 groups first, with subsequent loss of NO both in a reducing atmosphere and during thermal annealing. XPS was used to derive information on the oxidation state of Ru in the various steps of the annealing and/or reduction processes. (C) 1997 Elsevier Science B.V.