XPS and in-situ IR investigation of Ru/SiO2 catalyst

Sayan, S; Suzer, S; Uner, DENİZ

doi:10.1016/s0022-2860(96)09637-8

XPS and in-situ IR investigation of Ru/SiO2 catalyst

Sayan S., Suzer S., Uner D.

JOURNAL OF MOLECULAR STRUCTURE, cilt.410, ss.111-114, 1997 (SCI-Expanded, Scopus)

Yayın Türü: Makale / Tam Makale
Cilt numarası: 410
Basım Tarihi: 1997
Doi Numarası: 10.1016/s0022-2860(96)09637-8
Dergi Adı: JOURNAL OF MOLECULAR STRUCTURE
Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
Sayfa Sayıları: ss.111-114
Anahtar Kelimeler: Ru catalyst, XPS, in-situ IR, RUTHENIUM, SPECTROSCOPY
Orta Doğu Teknik Üniversitesi Adresli: Evet

Özet

Ru(NO)(NO3)(3)/SiO2 catalyst precursors were characterized via XPS and in-situ reflectance IR spectroscopy before, during and after reduction by hydrogen over the temperature range 300-800 K. IR results indicated that the catalyst precursor lost NO3 groups first, with subsequent loss of NO both in a reducing atmosphere and during thermal annealing. XPS was used to derive information on the oxidation state of Ru in the various steps of the annealing and/or reduction processes. (C) 1997 Elsevier Science B.V.