XPS and in-situ IR investigation of Ru/SiO2 catalyst

Sayan S., Suzer S., Uner D.

JOURNAL OF MOLECULAR STRUCTURE, vol.410, pp.111-114, 1997 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 410
  • Publication Date: 1997
  • Doi Number: 10.1016/s0022-2860(96)09637-8
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.111-114
  • Keywords: Ru catalyst, XPS, in-situ IR, RUTHENIUM, SPECTROSCOPY
  • Middle East Technical University Affiliated: Yes


Ru(NO)(NO3)(3)/SiO2 catalyst precursors were characterized via XPS and in-situ reflectance IR spectroscopy before, during and after reduction by hydrogen over the temperature range 300-800 K. IR results indicated that the catalyst precursor lost NO3 groups first, with subsequent loss of NO both in a reducing atmosphere and during thermal annealing. XPS was used to derive information on the oxidation state of Ru in the various steps of the annealing and/or reduction processes. (C) 1997 Elsevier Science B.V.