To appropriately assess, compensate for and/or potentially utilize piezoceramic transducer nonlinearities, reversible and irreversible, a suitable theoretical framework is needed. In this study such a framework is developed and experimentally validated. A constitutive model for the piezoceramic (PZT) wafer is formulated that incorporates reversible (anhysteretic) and irreversible (hysteretic) dielectric nonlinearity. This is accomplished by use of a generalized Maxwell resistive capacitor (GMRC) hysteresis model that is an extension of the MRC hysteresis model previously described by the authors. An identification scheme for the GMRC model is validated experimentally. The relationships of the MRC and GMRC hysteresis models to other hysteresis models, including Preisach, Prandtl-Ishlinskii, and Jiles-Atherton formulations, are also discussed. Experimental studies of a monolithic PZT wafer support the theoretical developments.