Ga2Se3 thin films were prepared by thermal evaporation technique and structural, optical characteristics of the deposited thin films were investigated in the present study. X-ray diffraction pattern of the thin film exhibited one intensive and sharp peak associated with (111) plane of cubic crystalline structure of the compound. Energy dispersive spectroscopic analyses pointed out the atomic compositional ratio of the constituent elements as consistent with chemical formula of Ga2Se3. The optical characteristics of thin film were studied by means of temperature-dependent transmission experiments carried out in between 10 and 300 K. The analyses to get band gap energies at applied temperatures were accomplished using absorption coefficient according to Tauc relation and derivative transmittance spectra. Absorption coefficient analyses end up with band gap energies increasing from 2.60 eV (room temperature) to 2.67 eV (10 K). The derivatives of transmittance spectra were also utilized for purpose and band gap energies were found very closer (max. +/- 0.02 eV deviation) to those of absorption coefficient analyses. Varshni and Fan models were applied to band gap energy vs. temperature plot and various optical parameters of Ga2Se3 thin film were determined.