The Use of Terahertz Spectroscopy as a Sensitive Probe in Discriminating the Electronic Properties of Structurally Similar Multi-Walled Carbon Nanotubes

Parrott, Edward; Zeitler, J.; McGregor, James; Oei, Shu-Pei; Unalan, HÜSNÜ; Milne, William; Tessonnier, Jean-Philippe; Su, Dong; Schloegl, Robert; Gladden, Lynn

doi:10.1002/adma.200900941

The Use of Terahertz Spectroscopy as a Sensitive Probe in Discriminating the Electronic Properties of Structurally Similar Multi-Walled Carbon Nanotubes

Parrott E. P. J., Zeitler J. A., McGregor J., Oei S., Unalan H. E., Milne W. I., ...Daha Fazla

ADVANCED MATERIALS, cilt.21, ss.3953-3958, 2009 (SCI-Expanded, Scopus)

Yayın Türü: Makale / Tam Makale
Cilt numarası: 21
Basım Tarihi: 2009
Doi Numarası: 10.1002/adma.200900941
Dergi Adı: ADVANCED MATERIALS
Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
Sayfa Sayıları: ss.3953-3958
Orta Doğu Teknik Üniversitesi Adresli: Evet

Özet

Terahertz: spectroscopy is used to definitively distinguish between two multi-walled carbon nanotubes (see figure), which have commercial applications in a number of advanced materials. Other techniques do not provide a sensitive discrimination of the measured properties. This observation is rationalized by considering the dielectric nature of the materials and the relationship of this to their structural differences.