Surface Recombination Noise in InAs/GaSb Superlattice Photodiodes

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Tansel T., Kutluer K., Muti A., Salihoglu O., Aydinli A., TURAN R.

APPLIED PHYSICS EXPRESS, cilt.6, sa.3, 2013 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 6 Sayı: 3
  • Basım Tarihi: 2013
  • Doi Numarası: 10.7567/apex.6.032202
  • Dergi Adı: APPLIED PHYSICS EXPRESS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Orta Doğu Teknik Üniversitesi Adresli: Evet

Özet

The standard Schottky noise approach alone is not sufficient to describe the noise mechanism in an InAs/GaSb superlattice photodetector at reverse negative bias. The additional noise identified appears at surface activation energies below 60 meV and is inversely proportional to the reverse bias. In order to satisfactorily explain the experimental data, we hereby propose the existence of a surface recombination noise that is a function of both the frequency and bias. The calculated noise characteristics indeed show good agreement with the experimental data. (C) 2013 The Japan Society of Applied Physics