Theory behind various
material characterization techniques. Transmission electron microscopy (TEM), scanning
electron microscopy (SEM), advanced
X-ray diffraction (XRD) techniques, atomic force microscopy (AFM). Fourier-transform
infrared spectroscopy (FTIR), ultraviolet/visible spectroscopy (UV/VIS), Raman
spectroscopy. Differential thermal analysis (DTA), thermogravimetric analysis
(TGA), differential scanning calorimetry (DSC). Dynamic light scattering (DLS),
zeta potential analysis. Vibrating-sample magnetometer (VSM), Hall effect
set-up.