Questioning Degree of Accuracy Offered by the Spectral Element Method in Computational Electromagnetics

Mahariq I., KURT H., KUZUOĞLU M.

APPLIED COMPUTATIONAL ELECTROMAGNETICS SOCIETY JOURNAL, cilt.30, sa.7, ss.698-705, 2015 (SCI-Expanded) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 30 Sayı: 7
  • Basım Tarihi: 2015
  • Dergi Adı: APPLIED COMPUTATIONAL ELECTROMAGNETICS SOCIETY JOURNAL
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.698-705
  • Anahtar Kelimeler: Deformation, electromagnetic scattering, finite difference, finite element, photonic nanojet, spectral element method, PERFECTLY MATCHED LAYER
  • Orta Doğu Teknik Üniversitesi Adresli: Evet

Özet

In this paper, a comparison amongst the spectral element method (SEM), the finite difference method (FDM), and the first-order finite element method (FEM) is presented. For the sake of consistency, the comparison is carried out on one-dimensional and two-dimensional boundary value problems based on the same measure of error in order to emphasize on the high accuracy gained by the SEM. Then, the deterioration in the accuracy of the SEM due to the elemental deformation is demonstrated. Following this, we try to answer the question: Do we need the high accuracy offered by the SEM in computational electromagnetics? The answer is supported by solving a typical, unbounded electromagnetic scattering problem in the frequency domain by the SEM. Domain truncation is performed by the well-known perfectly matched layer (PML).