Craven, M. Et Al. 2003. Structural and electrical characterization of a-plane GaN grown on a-plane SiC. 5th International Conference on Nitride Semiconductors (ICNS-5) , (Nara, Japan), 2132-2135.

Craven, M., Chakraborty, A., Imer, B., Wu, F., Keller, S., Mishra, U., ... Speck, J.(2003). Structural and electrical characterization of a-plane GaN grown on a-plane SiC . 5th International Conference on Nitride Semiconductors (ICNS-5) (pp.2132-2135). Nara, Japan

Craven, MD Et Al. "Structural and electrical characterization of a-plane GaN grown on a-plane SiC," 5th International Conference on Nitride Semiconductors (ICNS-5), Nara, Japan, 2003

Craven, MD Et Al. "Structural and electrical characterization of a-plane GaN grown on a-plane SiC." 5th International Conference on Nitride Semiconductors (ICNS-5) , Nara, Japan, pp.2132-2135, 2003

Craven, M. Et Al. (2003) . "Structural and electrical characterization of a-plane GaN grown on a-plane SiC." 5th International Conference on Nitride Semiconductors (ICNS-5) , Nara, Japan, pp.2132-2135.

@conferencepaper{conferencepaper, author={MD Craven Et Al. }, title={Structural and electrical characterization of a-plane GaN grown on a-plane SiC}, congress name={5th International Conference on Nitride Semiconductors (ICNS-5)}, city={Nara}, country={Japan}, year={2003}, pages={2132-2135} }